Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060981 | Guided inspection of a semiconductor wafer based on spatial density analysis | Yotam Sofer | 2021-07-13 |
| 10937706 | Method of examining defects in a semiconductor specimen and system thereof | Yotam Sofer | 2021-03-02 |
| 10504805 | Method of examining defects in a semiconductor specimen and system thereof | Yotam Sofer | 2019-12-10 |