Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Yotam Sofer, Boaz Cohen, Saar Shabtay | 2020-03-31 |
EB
Eli Buchman
Overall (All Time): #2,783,252 of 4,157,543Top 70%
1
Patents All Time