Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11940390 | Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interest | Yotam Sofer, Shaul Engler, Boaz Cohen, Amir Bar, Marcelo BACHER | 2024-03-26 |
| 11592400 | System, method and computer program product for object examination | Moshe Amzaleg, Zvi Goren | 2023-02-28 |
| 11360030 | Selecting a coreset of potential defects for estimating expected defects of interest | Yotam Sofer, Shaul Engler, Boaz Cohen, Amir Bar, Marcelo BACHER | 2022-06-14 |
| 10871451 | System, method and computer program product for object examination | Moshe Amzaleg, Zvi Goren | 2020-12-22 |
| 10818000 | Iterative defect filtering process | Idan Kaizerman, Amir Watchs | 2020-10-27 |
| 10605745 | Guided inspection of a semiconductor wafer based on systematic defects | Yotam Sofer, Boaz Cohen, Eli Buchman | 2020-03-31 |
| 10408764 | System, method and computer program product for object examination | Moshe Amzaleg, Zvi Goren | 2019-09-10 |
| 10049441 | Iterative defect filtering process | Idan Kaizerman, Amir Wachs | 2018-08-14 |
| 9286675 | Iterative defect filtering process | Idan Kaizerman, Amir Wachs | 2016-03-15 |