Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10347462 | Imaging of crystalline defects | Dror Shemesh, Uri Lev, Benjamin Colombeau, Kourosh Nafisi | 2019-07-09 |
| 10049441 | Iterative defect filtering process | Saar Shabtay, Idan Kaizerman | 2018-08-14 |
| 9958501 | System for electrical measurements of objects in a vacuumed environment | Alon Litman, Efim Vinnitsky | 2018-05-01 |
| 9880550 | Updating of a recipe for evaluating a manufacturing stage of an electrical circuit | — | 2018-01-30 |
| 9286675 | Iterative defect filtering process | Saar Shabtay, Idan Kaizerman | 2016-03-15 |
| 6949147 | In situ module for particle removal from solid-state surfaces | Yoram Uziel, David Yogev, Ehud Poles | 2005-09-27 |
| 6827816 | In situ module for particle removal from solid-state surfaces | Yoram Uziel, David Yogev, Ehud Poles | 2004-12-07 |
| 6799584 | Condensation-based enhancement of particle removal by suction | David Yogev, Yoram Uzeil, Lev Frisman | 2004-10-05 |
| 6238939 | Method of quality control in semiconductor device fabrication | David Cohen | 2001-05-29 |