Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10541104 | System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection | Alon Litman, Zvi Nir, Arnon Mizrahy | 2020-01-21 |
| 10347462 | Imaging of crystalline defects | Dror Shemesh, Benjamin Colombeau, Amir Wachs, Kourosh Nafisi | 2019-07-09 |