Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 10541104 | System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflection | Alon Litman, Zvi Nir, Arnon Mizrahy | 2020-01-21 | $34,637,000 |
| 10347462 | Imaging of crystalline defects | Dror Shemesh, Benjamin Colombeau, Amir Wachs, Kourosh Nafisi | 2019-07-09 | $20,979,000 |