Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11462300 | Methods and systems for sequence calling | Avishai Bartov, Yoav Etzioni, Mark Pratt, Gilad Almogy | 2022-10-04 |
| 10663407 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Idan Kaizerman | 2020-05-26 |
| 10290087 | Method of generating an examination recipe and system thereof | Ariel Shkalim, Moshe Amzaleg, Eyal NEISTEIN, Shlomo Tubul, Elad Cohen | 2019-05-14 |
| 10161882 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Idan Kaizerman | 2018-12-25 |
| 9401013 | Method of design-based defect classification and system thereof | Zvi Goren, Efrat Rozenman | 2016-07-26 |
| 9141730 | Method of generating a recipe for a manufacturing tool and system thereof | Avishai Bartov | 2015-09-22 |
| 8640060 | Method of generating a recipe for a manufacturing tool and system thereof | — | 2014-01-28 |
| 7155052 | Method for pattern inspection | Niv Shmueli, Gideon Friedmann, Orna Bregman-Amitai | 2006-12-26 |