Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815470 | Multi-perspective wafer analysis | Haim Feldman, Harel Ilan, Shahar Arad, Ido Almog, Ori Golani | 2023-11-14 |
| 11386539 | Detecting defects in a semiconductor specimen | Elad Cohen, Yuri Feigin, Lior Katz | 2022-07-12 |
| 11107207 | Detecting targeted locations in a semiconductor specimen | Elad Cohen, Yuri Feigin, Lior Katz | 2021-08-31 |
| 10902582 | Computerized system and method for obtaining information about a region of an object | Haim Feldman, Harel Ilan, Shahar Arad, Ido Almog | 2021-01-26 |
| 10460434 | Method of defect detection and system thereof | Limor Martin, Elad Cohen, Moshe Amzaleg | 2019-10-29 |
| 10290087 | Method of generating an examination recipe and system thereof | Ariel Shkalim, Moshe Amzaleg, Shlomo Tubul, Mark Geshel, Elad Cohen | 2019-05-14 |
| 10275872 | Method of detecting repeating defects and system thereof | Karen Pomeranz, Vivek Balasubramanian, Moshe Amzaleg, Eyal Bassa | 2019-04-30 |