Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11386539 | Detecting defects in a semiconductor specimen | Elad Cohen, Lior Katz, Eyal NEISTEIN | 2022-07-12 |
| 11107207 | Detecting targeted locations in a semiconductor specimen | Elad Cohen, Lior Katz, Eyal NEISTEIN | 2021-08-31 |
| 10484107 | Calibration network for a phased array antenna | — | 2019-11-19 |