Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12223641 | Defect detection of a semiconductor specimen | Boaz Dudovich, Assaf Ariel, Amir Bar, Lior Yehieli, Chen Itzikowitz +3 more | 2025-02-11 |
| 11386539 | Detecting defects in a semiconductor specimen | Elad Cohen, Yuri Feigin, Eyal NEISTEIN | 2022-07-12 |
| 11107207 | Detecting targeted locations in a semiconductor specimen | Elad Cohen, Yuri Feigin, Eyal NEISTEIN | 2021-08-31 |
| 10992840 | Obtaining printed element data of patches to determine calibration data of a printer | Uri Lidai, Rivay Mor, Iliya Shahamov, Pavel Blinchuk | 2021-04-27 |
| 10165150 | Printer with two scanners | Ran Waidman, Sagi Refael | 2018-12-25 |
| 10031458 | Reduce merging of adjacent printing dots on a photosensitive member | Yohanan Sivan, Ran Waidman | 2018-07-24 |
| 9253371 | Press color state estimator | Kogan Hadas, Doron Shaked | 2016-02-02 |
| 9124754 | System and method for position calibration of a spot of an optical sensor | Nadav Barkai, Gal Amit | 2015-09-01 |
| 9063884 | Analysis of health indicators of a system | Ayelet Pnueli, Ami Shiff, Avner Arnstein, Ron Maurer, Tsafrir Yedid Am | 2015-06-23 |
| 9036206 | Color uniformity correction using a scanner | Michal Aharon, Hadas Kogan, Meirav Naaman | 2015-05-19 |
| 8736905 | Position calibration of a spot of an optical sensor | Nadav Barkai, Gal Amit | 2014-05-27 |