Issued Patents All Time
Showing 25 most recent of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815470 | Multi-perspective wafer analysis | Eyal NEISTEIN, Harel Ilan, Shahar Arad, Ido Almog, Ori Golani | 2023-11-14 |
| 11385188 | System and method for defect detection using multi-spot scanning | Amir Shoham, Yoav Berlatzky | 2022-07-12 |
| 11270432 | Inspection of a three dimensional structure of a sample using a phase shift mask | Yoav Shechtman | 2022-03-08 |
| 10902582 | Computerized system and method for obtaining information about a region of an object | Eyal NEISTEIN, Harel Ilan, Shahar Arad, Ido Almog | 2021-01-26 |
| 10481101 | Asymmetrical magnification inspection system and illumination module | Boris Golberg, Ido Dolev | 2019-11-19 |
| 10386311 | System and method for defect detection using multi-spot scanning | Amir Shoham, Yoav Berlatzky | 2019-08-20 |
| 10060736 | Near-field sensor height control | Amir Sagiv, Yoram Uziel, Ron Naftali | 2018-08-28 |
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ron Naftali, Ofer Adan, Ofer Shneyour, Ron Bar-Or +1 more | 2017-12-05 |
| 9810643 | System and method for defect detection using multi-spot scanning | Amir Shoham, Yoav Berlatzky | 2017-11-07 |
| 9535014 | Systems and methods for inspecting an object | Ido Dolev, Ido Almog | 2017-01-03 |
| 9395266 | On-tool wavefront aberrations measurement system and method | Boris Golberg, Amir Sagiv, Uriel Malul, Adam Baer | 2016-07-19 |
| 9012875 | Inspection method and an inspection system exhibiting speckle reduction characteristics | Amir Shoham, Doron Shoham | 2015-04-21 |
| 8659754 | Inspection system and method for fast changes of focus | Boris Morgenstein, Roman Naidis, Adam Baer | 2014-02-25 |
| 8488117 | Inspection system and method for fast changes of focus | Boris Morgenstein, Roman Naidis, Adam Baer | 2013-07-16 |
| 8228601 | Scanning microscopy using inhomogeneous polarization | Doron Meshulach, Kobi Kan, Ido Dolev, Ori Sarfaty | 2012-07-24 |
| 8134699 | Illumination system for optical inspection | Ron Naftali, Avishay Guetta, Doron Shoham | 2012-03-13 |
| 7973919 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali | 2011-07-05 |
| 7924419 | Illumination system for optical inspection | Ron Naftali, Avishay Guetta, Doron Shoham | 2011-04-12 |
| 7714999 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali | 2010-05-11 |
| 7684048 | Scanning microscopy | Doron Meshulach | 2010-03-23 |
| 7634754 | Simulation of aerial images | — | 2009-12-15 |
| 7630069 | Illumination system for optical inspection | Ron Naftali, Avishay Guetta, Doron Shoham | 2009-12-08 |
| 7620932 | Simulation of aerial images | — | 2009-11-17 |
| 7576348 | One-dimensional phase contrast microscopy with a traveling lens generated by a step function change | Doron Meshulach, Eyal Angel | 2009-08-18 |
| 7518718 | High throughput inspection system and a method for generating transmitted and/or reflected images | Emanuel Elyasaf, Simon Yalov, Eitan Lahat | 2009-04-14 |