| 12436401 |
Polarization optical system |
Boris Golberg, Avishai Bartov, Ron Naftali |
2025-10-07 |
|
| 11815470 |
Multi-perspective wafer analysis |
Eyal NEISTEIN, Harel Ilan, Shahar Arad, Ido Almog, Ori Golani |
2023-11-14 |
$33,075,000 |
| 11385188 |
System and method for defect detection using multi-spot scanning |
Amir Shoham, Yoav Berlatzky |
2022-07-12 |
$30,931,000 |
| 11270432 |
Inspection of a three dimensional structure of a sample using a phase shift mask |
Yoav Shechtman |
2022-03-08 |
$69,139,000 |
| 10902582 |
Computerized system and method for obtaining information about a region of an object |
Eyal NEISTEIN, Harel Ilan, Shahar Arad, Ido Almog |
2021-01-26 |
$35,448,000 |
| 10481101 |
Asymmetrical magnification inspection system and illumination module |
Boris Golberg, Ido Dolev |
2019-11-19 |
$24,323,000 |
| 10386311 |
System and method for defect detection using multi-spot scanning |
Amir Shoham, Yoav Berlatzky |
2019-08-20 |
$26,004,000 |
| 10060736 |
Near-field sensor height control |
Amir Sagiv, Yoram Uziel, Ron Naftali |
2018-08-28 |
|
| 9835563 |
Evaluation system and a method for evaluating a substrate |
Yoram Uziel, Ron Naftali, Ofer Adan, Ofer Shneyour, Ron Bar-Or +1 more |
2017-12-05 |
$41,374,000 |
| 9810643 |
System and method for defect detection using multi-spot scanning |
Amir Shoham, Yoav Berlatzky |
2017-11-07 |
$31,945,000 |
| 9535014 |
Systems and methods for inspecting an object |
Ido Dolev, Ido Almog |
2017-01-03 |
$13,194,000 |
| 9395266 |
On-tool wavefront aberrations measurement system and method |
Boris Golberg, Amir Sagiv, Uriel Malul, Adam Baer |
2016-07-19 |
$14,320,000 |
| 9012875 |
Inspection method and an inspection system exhibiting speckle reduction characteristics |
Amir Shoham, Doron Shoham |
2015-04-21 |
$14,570,000 |
| 8659754 |
Inspection system and method for fast changes of focus |
Boris Morgenstein, Roman Naidis, Adam Baer |
2014-02-25 |
$9,855,000 |
| 8488117 |
Inspection system and method for fast changes of focus |
Boris Morgenstein, Roman Naidis, Adam Baer |
2013-07-16 |
$14,286,000 |
| 8228601 |
Scanning microscopy using inhomogeneous polarization |
Doron Meshulach, Kobi Kan, Ido Dolev, Ori Sarfaty |
2012-07-24 |
$7,359,000 |
| 8134699 |
Illumination system for optical inspection |
Ron Naftali, Avishay Guetta, Doron Shoham |
2012-03-13 |
$10,387,000 |
| 7973919 |
High resolution wafer inspection system |
Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali |
2011-07-05 |
$5,297,000 |
| 7924419 |
Illumination system for optical inspection |
Ron Naftali, Avishay Guetta, Doron Shoham |
2011-04-12 |
$6,345,000 |
| 7714999 |
High resolution wafer inspection system |
Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali |
2010-05-11 |
$24,414,000 |
| 7684048 |
Scanning microscopy |
Doron Meshulach |
2010-03-23 |
$9,727,000 |
| 7634754 |
Simulation of aerial images |
— |
2009-12-15 |
$35,722,000 |
| 7630069 |
Illumination system for optical inspection |
Ron Naftali, Avishay Guetta, Doron Shoham |
2009-12-08 |
$20,724,000 |
| 7620932 |
Simulation of aerial images |
— |
2009-11-17 |
$14,573,000 |
| 7576348 |
One-dimensional phase contrast microscopy with a traveling lens generated by a step function change |
Doron Meshulach, Eyal Angel |
2009-08-18 |
$17,494,000 |
