Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7973919 | High resolution wafer inspection system | Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman | 2011-07-05 |
| 7714999 | High resolution wafer inspection system | Moshe Langer, Roman Kris, Silviu Reinhorn, Ron Naftali, Haim Feldman | 2010-05-11 |