Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10910193 | Particle detection assembly, system and method | Eli Cheifetz, Amit Weingarten, Semyon Shopman, Dmitry Shur | 2021-02-02 |
| 10236155 | Detection assembly, system and method | Eli Cheifetz, Amit Weingarten, Semyon Shofman | 2019-03-19 |
| 9076632 | Position sensitive STEM detector | Eli Cheifetz, Amit Weingarten | 2015-07-07 |
| 7973919 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Ron Naftali, Haim Feldman | 2011-07-05 |
| 7714999 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Ron Naftali, Haim Feldman | 2010-05-11 |
| 7463352 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2008-12-09 |
| 7399647 | Multi beam scanning with bright/dark field imaging | — | 2008-07-15 |
| 7190459 | Multi beam scanning with bright/dark field imaging | — | 2007-03-13 |
| 7053395 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg | 2006-05-30 |
| 7049586 | Multi beam scanning with bright/dark field imaging | — | 2006-05-23 |
| 6924891 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2005-08-02 |
| 6853446 | Variable angle illumination wafer inspection system | Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Boris Goldberg, Daniel I. Some | 2005-02-08 |
| 6853475 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg | 2005-02-08 |
| 6809808 | Wafer defect detection system with traveling lens multi-beam scanner | Haim Feldman, Emanuel Elyasaf, Nissim Elmaliach, Ron Naftali, Boris Golberg | 2004-10-26 |
| 6798505 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elyasaf, Shimon Yalov, Boaz Kenan | 2004-09-28 |
| 6791099 | Laser scanning wafer inspection using nonlinear optical phenomena | Daniel I. Some, Gilad Almogy | 2004-09-14 |
| 6788445 | Multi-beam polygon scanning system | Boris Goldberg | 2004-09-07 |
| 6671398 | Method and apparatus for inspection of patterned semiconductor wafers | Gilad Almogy | 2003-12-30 |
| 6587194 | Method of and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2003-07-01 |
| 6556294 | Method of and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2003-04-29 |
| 6429931 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2002-08-06 |
| 6369888 | Method and apparatus for article inspection including speckle reduction | Avner Karpol, Emanuel Elysaf, Shimon Yalov, Boaz Kenan | 2002-04-09 |
| 6317514 | Method and apparatus for inspection of patterned semiconductor wafers | Gilad Almogy | 2001-11-13 |
| 6185015 | Compact planar optical correlator | Asher Friesem, Yaakov Amitai | 2001-02-06 |
| 6172778 | Compact optical crossbar switch | Asher Friesem, Yaakov Amitai, Shachar Gorodeisky | 2001-01-09 |