Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12274569 | System and method for performing spiral-trajectory tomosynthesis | Serguei Gouzeev | 2025-04-15 |
| 12163901 | Systems and methods for x-ray computed tomography | Serguei Gouzeev, Michael Hellmann, David R. Zavagno | 2024-12-10 |
| 11846592 | Systems and methods for X-ray computed tomography | Serguei Gouzeev, Michael Hellmann, David R. Zavagno | 2023-12-19 |
| 11099140 | Systems and methods for X-ray computed tomography | Serguei Gouzeev, Michael Hellmann, David R. Zavagno | 2021-08-24 |
| 11057538 | Methods and systems for tagged-signal verification | Vittaly Tavor | 2021-07-06 |
| 9244290 | Method and system for coherence reduction | Roman Vander, Shmuel Mangan, Amir Sagiv | 2016-01-26 |
| 8213024 | Method and system for aerial imaging of a reticle | Shmuel Mangan, Ishai Schwarzband, On Haran, Michael Ben-Yishay, Amir Sagiv +1 more | 2012-07-03 |
| 7460221 | Method and system for detecting defects | Ron Naftali | 2008-12-02 |
| 7268343 | Method and system for detecting defects | Ron Naftali | 2007-09-11 |
| 7173694 | Method and system for detecting defects | Ron Naftali | 2007-02-06 |
| 7053999 | Method and system for detecting defects | Ron Naftali | 2006-05-30 |
| 6943898 | Apparatus and method for dual spot inspection of repetitive patterns | Alexander Libinson, Haim Feldman, Daniel I. Some | 2005-09-13 |
| 6914670 | Defect detection with enhanced dynamic range | Gilad Almogy, Ron Naftali | 2005-07-05 |
| 6882417 | Method and system for detecting defects | Ron Naftali | 2005-04-19 |
| 6853446 | Variable angle illumination wafer inspection system | Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Daniel I. Some | 2005-02-08 |
| 6788445 | Multi-beam polygon scanning system | Silviu Reinhorn | 2004-09-07 |
| 6657714 | Defect detection with enhanced dynamic range | Gilad Almogy, Ron Naftali | 2003-12-02 |
| 6366352 | Optical inspection method and apparatus utilizing a variable angle design | Amir Komem, Ron Naftali, Gilad Almogy | 2002-04-02 |