| 12429464 |
Differential refractometer for gradient chromatography |
— |
2025-09-30 |
| 12135316 |
Controlling the purification of a macromolecule solution via real-time multi-angle light scattering |
— |
2024-11-05 |
| 12085495 |
Calculating molar mass values of components of and molar mass concentration values of conjugate molecules/particles |
Michelle H. Chen |
2024-09-10 |
| 12038376 |
Purifying a sample solution via real-time multi-angle light scattering |
Michael I. Larkin |
2024-07-16 |
| 11579079 |
Differential refractometer for gradient chromatography |
— |
2023-02-14 |
| 9347869 |
Multiwell plate lid for improved optical measurements |
Michael I. Larkin, Amy D. Hanlon, Richard J. Sleiman, David N. Villalpando |
2016-05-24 |
| 9146192 |
Integrated light scattering and ultraviolet absorption measurement system |
David N. Villalpando |
2015-09-29 |
| 8976353 |
Multiwell plate lid for improved optical measurements |
Michael I. Larkin, Amy D. Hanlon, Richard J. Sleiman, David N. Villalpando |
2015-03-10 |
| 8964177 |
Method and apparatus to illuminate sample and containing vessel in a light scattering detector |
Michael I. Larkin, Peter G. Neilson, David N. Villalpando |
2015-02-24 |
| 8195405 |
Method for characterizing reversible association of macromolecules at high concentration |
— |
2012-06-05 |
| 7813882 |
Method for determining average properties of molecules in solution |
Steven P. Trainoff |
2010-10-12 |
| 7693323 |
Multi-detector defect detection system and a method for detecting defects |
Evgeni Levin, Mirta Perlman |
2010-04-06 |
| 7589835 |
High speed laser scanning inspection system |
— |
2009-09-15 |
| 7433053 |
Laser inspection using diffractive elements for enhancement and suppression of surface features |
— |
2008-10-07 |
| 7365836 |
High speed laser scanning inspection system |
— |
2008-04-29 |
| 7359045 |
High speed laser scanning inspection system |
— |
2008-04-15 |
| 7027142 |
Optical technique for detecting buried defects in opaque films |
— |
2006-04-11 |
| 7009695 |
Full frame thermal pump probe technique for detecting subsurface defects |
— |
2006-03-07 |
| 7006224 |
Method and system for optical inspection of an object |
— |
2006-02-28 |
| 6943898 |
Apparatus and method for dual spot inspection of repetitive patterns |
Alexander Libinson, Haim Feldman, Boris Goldberg |
2005-09-13 |
| 6853446 |
Variable angle illumination wafer inspection system |
Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Boris Goldberg |
2005-02-08 |
| 6791099 |
Laser scanning wafer inspection using nonlinear optical phenomena |
Silviu Reinhorn, Gilad Almogy |
2004-09-14 |
| 6686602 |
Patterned wafer inspection using spatial filtering |
— |
2004-02-03 |
