Daniel I. Some — 23 Patents at Applied Materials

Daniel I. Some has been granted 23 US patents while listed as an inventor at Applied Materials. The first was granted in 2004 and the most recent in September 2025. Daniel I. Some ranks #178,160 of 4,157,543 US inventors in our database (top 4.3%). Patent records list Daniel I. Some in Atlit, CA, IL.

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12429464	Differential refractometer for gradient chromatography	—	2025-09-30
12135316	Controlling the purification of a macromolecule solution via real-time multi-angle light scattering	—	2024-11-05
12085495	Calculating molar mass values of components of and molar mass concentration values of conjugate molecules/particles	Michelle H. Chen	2024-09-10
12038376	Purifying a sample solution via real-time multi-angle light scattering	Michael I. Larkin	2024-07-16
11579079	Differential refractometer for gradient chromatography	—	2023-02-14
9347869	Multiwell plate lid for improved optical measurements	Michael I. Larkin, Amy D. Hanlon, Richard J. Sleiman, David N. Villalpando	2016-05-24
9146192	Integrated light scattering and ultraviolet absorption measurement system	David N. Villalpando	2015-09-29
8976353	Multiwell plate lid for improved optical measurements	Michael I. Larkin, Amy D. Hanlon, Richard J. Sleiman, David N. Villalpando	2015-03-10
8964177	Method and apparatus to illuminate sample and containing vessel in a light scattering detector	Michael I. Larkin, Peter G. Neilson, David N. Villalpando	2015-02-24
8195405	Method for characterizing reversible association of macromolecules at high concentration	—	2012-06-05
7813882	Method for determining average properties of molecules in solution	Steven P. Trainoff	2010-10-12
7693323	Multi-detector defect detection system and a method for detecting defects	Evgeni Levin, Mirta Perlman	2010-04-06	$18,503,000
7589835	High speed laser scanning inspection system	—	2009-09-15	$12,042,000
7433053	Laser inspection using diffractive elements for enhancement and suppression of surface features	—	2008-10-07	$9,830,000
7365836	High speed laser scanning inspection system	—	2008-04-29	$20,360,000
7359045	High speed laser scanning inspection system	—	2008-04-15	$34,057,000
7027142	Optical technique for detecting buried defects in opaque films	—	2006-04-11	$23,457,000
7009695	Full frame thermal pump probe technique for detecting subsurface defects	—	2006-03-07	$14,479,000
7006224	Method and system for optical inspection of an object	—	2006-02-28	$21,386,000
6943898	Apparatus and method for dual spot inspection of repetitive patterns	Alexander Libinson, Haim Feldman, Boris Goldberg	2005-09-13	$19,169,000
6853446	Variable angle illumination wafer inspection system	Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Boris Goldberg	2005-02-08	$20,730,000
6791099	Laser scanning wafer inspection using nonlinear optical phenomena	Silviu Reinhorn, Gilad Almogy	2004-09-14	$26,156,000
6686602	Patterned wafer inspection using spatial filtering	—	2004-02-03	$30,271,000

Daniel I. Some — 23 Patents

Issued Patents All Time

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