Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429464 | Differential refractometer for gradient chromatography | — | 2025-09-30 |
| 12135316 | Controlling the purification of a macromolecule solution via real-time multi-angle light scattering | — | 2024-11-05 |
| 12085495 | Calculating molar mass values of components of and molar mass concentration values of conjugate molecules/particles | Michelle H. Chen | 2024-09-10 |
| 12038376 | Purifying a sample solution via real-time multi-angle light scattering | Michael I. Larkin | 2024-07-16 |
| 11579079 | Differential refractometer for gradient chromatography | — | 2023-02-14 |
| 9347869 | Multiwell plate lid for improved optical measurements | Michael I. Larkin, Amy D. Hanlon, Richard J. Sleiman, David N. Villalpando | 2016-05-24 |
| 9146192 | Integrated light scattering and ultraviolet absorption measurement system | David N. Villalpando | 2015-09-29 |
| 8976353 | Multiwell plate lid for improved optical measurements | Michael I. Larkin, Amy D. Hanlon, Richard J. Sleiman, David N. Villalpando | 2015-03-10 |
| 8964177 | Method and apparatus to illuminate sample and containing vessel in a light scattering detector | Michael I. Larkin, Peter G. Neilson, David N. Villalpando | 2015-02-24 |
| 8195405 | Method for characterizing reversible association of macromolecules at high concentration | — | 2012-06-05 |
| 7813882 | Method for determining average properties of molecules in solution | Steven P. Trainoff | 2010-10-12 |
| 7693323 | Multi-detector defect detection system and a method for detecting defects | Evgeni Levin, Mirta Perlman | 2010-04-06 |
| 7589835 | High speed laser scanning inspection system | — | 2009-09-15 |
| 7433053 | Laser inspection using diffractive elements for enhancement and suppression of surface features | — | 2008-10-07 |
| 7365836 | High speed laser scanning inspection system | — | 2008-04-29 |
| 7359045 | High speed laser scanning inspection system | — | 2008-04-15 |
| 7027142 | Optical technique for detecting buried defects in opaque films | — | 2006-04-11 |
| 7009695 | Full frame thermal pump probe technique for detecting subsurface defects | — | 2006-03-07 |
| 7006224 | Method and system for optical inspection of an object | — | 2006-02-28 |
| 6943898 | Apparatus and method for dual spot inspection of repetitive patterns | Alexander Libinson, Haim Feldman, Boris Goldberg | 2005-09-13 |
| 6853446 | Variable angle illumination wafer inspection system | Gilad Almogy, Hadar Mazaki, Zvi Howard Phillip, Silviu Reinhorn, Boris Goldberg | 2005-02-08 |
| 6791099 | Laser scanning wafer inspection using nonlinear optical phenomena | Silviu Reinhorn, Gilad Almogy | 2004-09-14 |
| 6686602 | Patterned wafer inspection using spatial filtering | — | 2004-02-03 |