Issued Patents All Time
Showing 25 most recent of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362131 | Method for inspecting a specimen and charged particle beam device | Pieter Kruit, Jürgen Frosien, Ralf Schmid, Benjamin John Cook, Roman Barday +1 more | 2025-07-15 |
| 11803961 | Die-to-multi-die wafer inspection | Yariv Simovitch, Guy Shwartz, Ido Almog | 2023-10-31 |
| 11177048 | Method and system for evaluating objects | Igor Krivts (Krayvitz), Efim Vinnitsky, Yoram Uziel, Benzion Sender | 2021-11-16 |
| 10811219 | Method for evaluating a region of an object | Ofer Shneyour, Ronnie Porat | 2020-10-20 |
| 10504687 | Signal separator for a multi-beam charged particle inspection apparatus | Pieter Kruit | 2019-12-10 |
| 10446434 | Chuck for supporting a wafer | Doron Korngut, Yuri Belenky, Yoram Uziel, Ron Bar-Or, Yuval Gronau | 2019-10-15 |
| 10421125 | Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocity | Hou T. Ng, Christopher G. Talbot | 2019-09-24 |
| 10395887 | Apparatus and method for inspecting a surface of a sample, using a multi-beam charged particle column | Pieter Kruit | 2019-08-27 |
| 10307822 | Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturing | Hou T. Ng, Christopher G. Talbot | 2019-06-04 |
| 10068748 | Scanning an object using multiple mechanical stages | Yoram Uziel, Benzion Sender, Doron Aspir, Yohanan Madmon, Yuri Belenky | 2018-09-04 |
| 10060736 | Near-field sensor height control | Amir Sagiv, Yoram Uziel, Haim Feldman | 2018-08-28 |
| 10054551 | Inspection system and method for inspecting a sample by using a plurality of spaced apart beams | Boris Golberg | 2018-08-21 |
| 9997328 | System and method for forming a sealed chamber | Michael R. Rice, Natan Schlimoff, Igor Krivts (Krayvitz), Israel Avneri, Yoram Uziel +3 more | 2018-06-12 |
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ofer Adan, Haim Feldman, Ofer Shneyour, Ron Bar-Or +1 more | 2017-12-05 |
| 9784689 | Method and system for inspecting an object with an array of beams | Ido Almog | 2017-10-10 |
| 9297692 | System and method for inspecting a sample using landing lens | Yoram Uziel, Alon Litman, Ofer Adan, Juergen Frosien | 2016-03-29 |
| 8134699 | Illumination system for optical inspection | Avishay Guetta, Haim Feldman, Doron Shoham | 2012-03-13 |
| 7973919 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Haim Feldman | 2011-07-05 |
| 7924419 | Illumination system for optical inspection | Avishay Guetta, Haim Feldman, Doron Shoham | 2011-04-12 |
| 7714999 | High resolution wafer inspection system | Dan Grossman, Moshe Langer, Roman Kris, Silviu Reinhorn, Haim Feldman | 2010-05-11 |
| 7630069 | Illumination system for optical inspection | Avishay Guetta, Haim Feldman, Doron Shoham | 2009-12-08 |
| 7498557 | Cascaded image intensifier | Iddo Pinkas, Tal Kuzniz, Avishay Guetta, Helmut Banzhoff | 2009-03-03 |
| 7468507 | Optical spot grid array scanning system | Steven R. Rogers, Nissim Elmaliach, Emanuel Elyasef, Alon Litman, Doron Meshulach | 2008-12-23 |
| 7468506 | Spot grid array scanning system | Steven R. Rogers, Nissim Elmaliach, Emanuel Elyasef, Alon Litman | 2008-12-23 |
| 7463351 | Process and assembly for non-destructive surface inspection | Gilad Almogy, Avishay Guetta, Doron Shoham | 2008-12-09 |