Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11662324 | Three-dimensional surface metrology of wafers | Ido Almog, Lior Yaron | 2023-05-30 |
| 10446434 | Chuck for supporting a wafer | Doron Korngut, Yuri Belenky, Yoram Uziel, Ron Naftali, Yuval Gronau | 2019-10-15 |
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ron Naftali, Ofer Adan, Haim Feldman, Ofer Shneyour +1 more | 2017-12-05 |