Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11250560 | Methods and systems for expediting multi-perspective wafer analysis | Ido Almog | 2022-02-15 |
| 11195267 | Multi-perspective wafer analysis using an acousto-optic deflector | Harel Ilan, Ori Golani, Ido Almog | 2021-12-07 |
| 10446434 | Chuck for supporting a wafer | Yuri Belenky, Yoram Uziel, Ron Naftali, Ron Bar-Or, Yuval Gronau | 2019-10-15 |
| 9927210 | Laser daylight designation and pointing | Avishay Guetta, Michael Yagudaev | 2018-03-27 |
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ron Naftali, Ofer Adan, Haim Feldman, Ofer Shneyour +1 more | 2017-12-05 |
| 9761102 | Terrain surveillance system | Avishay Guetta, Michael Yagudaev | 2017-09-12 |
| 9590000 | Laser daylight designation and pointing | Avishay Guetta, Michael Yagudaev | 2017-03-07 |
| 8970374 | Intrusion warning system | Avishay Guetta, Gil Blai | 2015-03-03 |
| 7586596 | Field folding optical method for imaging system | Avishay Guetta, Gil Blai, Yoni Cohen | 2009-09-08 |
| 7586959 | Speckle reduction with transparent blocks | Avishay Guetta | 2009-09-08 |
| 7397552 | Optical inspection with alternating configurations | Avishay Guetta, Doron Shoham, Iddo Pinkas, Ronen Eynat | 2008-07-08 |
| 7339661 | Dark field inspection system | Erez Admoni, Ofer Kadar, Lev Haikoviz, Haim Feldman, Avishay Guetta | 2008-03-04 |
| 7265900 | Inspection system with oblique viewing angle | Benjamin Cohen, Avishay Guetta | 2007-09-04 |