| 11250560 |
Methods and systems for expediting multi-perspective wafer analysis |
Ido Almog |
2022-02-15 |
| 11195267 |
Multi-perspective wafer analysis using an acousto-optic deflector |
Harel Ilan, Ori Golani, Ido Almog |
2021-12-07 |
| 10446434 |
Chuck for supporting a wafer |
Yuri Belenky, Yoram Uziel, Ron Naftali, Ron Bar-Or, Yuval Gronau |
2019-10-15 |
| 9927210 |
Laser daylight designation and pointing |
Avishay Guetta, Michael Yagudaev |
2018-03-27 |
| 9835563 |
Evaluation system and a method for evaluating a substrate |
Yoram Uziel, Ron Naftali, Ofer Adan, Haim Feldman, Ofer Shneyour +1 more |
2017-12-05 |
| 9761102 |
Terrain surveillance system |
Avishay Guetta, Michael Yagudaev |
2017-09-12 |
| 9590000 |
Laser daylight designation and pointing |
Avishay Guetta, Michael Yagudaev |
2017-03-07 |
| 8970374 |
Intrusion warning system |
Avishay Guetta, Gil Blai |
2015-03-03 |
| 7586596 |
Field folding optical method for imaging system |
Avishay Guetta, Gil Blai, Yoni Cohen |
2009-09-08 |
| 7586959 |
Speckle reduction with transparent blocks |
Avishay Guetta |
2009-09-08 |
| 7397552 |
Optical inspection with alternating configurations |
Avishay Guetta, Doron Shoham, Iddo Pinkas, Ronen Eynat |
2008-07-08 |
| 7339661 |
Dark field inspection system |
Erez Admoni, Ofer Kadar, Lev Haikoviz, Haim Feldman, Avishay Guetta |
2008-03-04 |
| 7265900 |
Inspection system with oblique viewing angle |
Benjamin Cohen, Avishay Guetta |
2007-09-04 |
