Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523714 | Electrical inspection of electronic devices using electron-beam induced plasma probes | Alexander Kadyshevitch, Arie Glazer, Ronen Loewinger, Abraham Gross, Daniel Toet | 2016-12-20 |
| 7339661 | Dark field inspection system | Doron Korngut, Erez Admoni, Lev Haikoviz, Haim Feldman, Avishay Guetta | 2008-03-04 |