Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12278085 | Hybrid scanning electron microscopy and acousto-optic based metrology | Guy Shwartz, Ori Golani, Itamar Shani | 2025-04-15 |
| 11859963 | Depth profiling of semiconductor structures using picosecond ultrasonics | Ori Golani | 2024-01-02 |
| 11815470 | Multi-perspective wafer analysis | Haim Feldman, Eyal NEISTEIN, Harel Ilan, Shahar Arad, Ori Golani | 2023-11-14 |
| 11803961 | Die-to-multi-die wafer inspection | Ron Naftali, Yariv Simovitch, Guy Shwartz | 2023-10-31 |
| 11713964 | Cathodoluminescence focal scans to characterize 3D NAND CH profile | David Goldovsky, Ronny Barnea | 2023-08-01 |
| 11688055 | Methods and systems for analysis of wafer scan data | Guy Shwartz | 2023-06-27 |
| 11662324 | Three-dimensional surface metrology of wafers | Ron Bar-Or, Lior Yaron | 2023-05-30 |
| 11519720 | Depth profiling of semiconductor structures using picosecond ultrasonics | Ori Golani | 2022-12-06 |
| 11250560 | Methods and systems for expediting multi-perspective wafer analysis | Doron Korngut | 2022-02-15 |
| 11195267 | Multi-perspective wafer analysis using an acousto-optic deflector | Harel Ilan, Doron Korngut, Ori Golani | 2021-12-07 |
| 11035803 | Multi-perspective examination of a specimen | Ori Golani | 2021-06-15 |
| 10902582 | Computerized system and method for obtaining information about a region of an object | Haim Feldman, Eyal NEISTEIN, Harel Ilan, Shahar Arad | 2021-01-26 |
| 9784689 | Method and system for inspecting an object with an array of beams | Ron Naftali | 2017-10-10 |
| 9535014 | Systems and methods for inspecting an object | Haim Feldman, Ido Dolev | 2017-01-03 |