Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11803961 | Die-to-multi-die wafer inspection | Ron Naftali, Guy Shwartz, Ido Almog | 2023-10-31 |
| 11644426 | Methods and systems for generating calibration data for wafer analysis | — | 2023-05-09 |
| 11029253 | Computerized method for configuring an inspection system, computer program product and an inspection system | Amir Shoham, Ido Dolev | 2021-06-08 |