Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399133 | Optical inspection using controlled illumination and collection polarization | Elad Eizner | 2025-08-26 |
| 11796783 | Optical inspection using controlled illumination and collection polarization | Elad Eizner | 2023-10-24 |
| 11385188 | System and method for defect detection using multi-spot scanning | Yoav Berlatzky, Haim Feldman | 2022-07-12 |
| 11105740 | Optical inspection | Binyamin Kirshner, David Goldovsky, Nitzan Chamiel | 2021-08-31 |
| 11029253 | Computerized method for configuring an inspection system, computer program product and an inspection system | Ido Dolev, Yariv Simovitch | 2021-06-08 |
| 10386311 | System and method for defect detection using multi-spot scanning | Yoav Berlatzky, Haim Feldman | 2019-08-20 |
| 9810643 | System and method for defect detection using multi-spot scanning | Yoav Berlatzky, Haim Feldman | 2017-11-07 |
| 9470751 | Detecting open and short of conductors | Alon Litman | 2016-10-18 |
| 9354212 | Inspection having a segmented pupil | Yoav Berlatzky, Ido Dolev | 2016-05-31 |
| 9012875 | Inspection method and an inspection system exhibiting speckle reduction characteristics | Haim Feldman, Doron Shoham | 2015-04-21 |
| 8207499 | Variable rate scanning in an electron microscope | Benzion Sender, Alon Litman | 2012-06-26 |
| 7764426 | System and method for producing a light beam with spatially varying polarization | Stephen G. Lipson | 2010-07-27 |