Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11525777 | Optimizing signal-to-noise ratio in optical imaging of defects on unpatterned wafers | Yechiel Kapoano, David Goldovsky | 2022-12-13 |
| 11474437 | Increasing signal-to-noise ratio in optical imaging of defects on unpatterned wafers | Yechiel Kapoano, David Goldovsky | 2022-10-18 |
| 11105740 | Optical inspection | Amir Shoham, David Goldovsky, Nitzan Chamiel | 2021-08-31 |
| 10295476 | System and method for multiple mode inspection of a sample | Yehiel Kapoano | 2019-05-21 |
| 9690105 | Calibratable beam shaping system and method | Haim Eder | 2017-06-27 |
| 9291825 | Calibratable beam shaping system and method | Haim Eder | 2016-03-22 |