Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12456600 | Scanning electron microscopy-based tomography of specimens | Itamar Shani, Konstantin Chirko, Lior Yaron, Guy Eytan | 2025-10-28 | |
| 12278085 | Hybrid scanning electron microscopy and acousto-optic based metrology | Ori Golani, Itamar Shani, Ido Almog | 2025-04-15 | |
| 11803961 | Die-to-multi-die wafer inspection | Ron Naftali, Yariv Simovitch, Ido Almog | 2023-10-31 | $79,893,000 |
| 11688055 | Methods and systems for analysis of wafer scan data | Ido Almog | 2023-06-27 | $59,089,000 |