Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12278085 | Hybrid scanning electron microscopy and acousto-optic based metrology | Ori Golani, Itamar Shani, Ido Almog | 2025-04-15 |
| 11803961 | Die-to-multi-die wafer inspection | Ron Naftali, Yariv Simovitch, Ido Almog | 2023-10-31 |
| 11688055 | Methods and systems for analysis of wafer scan data | Ido Almog | 2023-06-27 |