Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815470 | Multi-perspective wafer analysis | Haim Feldman, Eyal NEISTEIN, Harel Ilan, Ido Almog, Ori Golani | 2023-11-14 |
| 10957034 | Method of examination of a specimen and system thereof | Elad Cohen | 2021-03-23 |
| 10902582 | Computerized system and method for obtaining information about a region of an object | Haim Feldman, Eyal NEISTEIN, Harel Ilan, Ido Almog | 2021-01-26 |