Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12250503 | Prediction of electrical properties of a semiconductor specimen | — | 2025-03-11 |
| 10957567 | Method, computer program product and system for detecting manufacturing process defects | Moshe Amzaleg | 2021-03-23 |
| 10354376 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2019-07-16 |
| 10049904 | Method and system for moving a substrate | Israel Avneri, Yoram Uziel, Igor Krivts (Krayvitz), Niranjan Ramchandra Khasgiwale | 2018-08-14 |
| 9916652 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2018-03-13 |
| 9835563 | Evaluation system and a method for evaluating a substrate | Yoram Uziel, Ron Naftali, Haim Feldman, Ofer Shneyour, Ron Bar-Or +1 more | 2017-12-05 |
| 9530199 | Technique for measuring overlay between layers of a multilayer structure | Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more | 2016-12-27 |
| 9383196 | System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensions | Yuval Yahav | 2016-07-05 |
| 9297692 | System and method for inspecting a sample using landing lens | Yoram Uziel, Alon Litman, Ron Naftali, Juergen Frosien | 2016-03-29 |
| 9046475 | High electron energy based overlay error measurement methods and systems | Moshe Langer, Ram Peltinov, Yoram Uziel, Ori Shoval | 2015-06-02 |