Ofer Adan — 10 Patents at Applied Materials

Ofer Adan has been granted 10 US patents while listed as an inventor at Applied Materials. The first was granted in 2015 and the most recent in March 2025. Ofer Adan ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Ofer Adan in Rehovot, IL.

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12250503	Prediction of electrical properties of a semiconductor specimen	—	2025-03-11
10957567	Method, computer program product and system for detecting manufacturing process defects	Moshe Amzaleg	2021-03-23	$48,969,000
10354376	Technique for measuring overlay between layers of a multilayer structure	Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more	2019-07-16	$26,330,000
10049904	Method and system for moving a substrate	Israel Avneri, Yoram Uziel, Igor Krivts (Krayvitz), Niranjan Ramchandra Khasgiwale	2018-08-14	$24,993,000
9916652	Technique for measuring overlay between layers of a multilayer structure	Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more	2018-03-13	$33,804,000
9835563	Evaluation system and a method for evaluating a substrate	Yoram Uziel, Ron Naftali, Haim Feldman, Ofer Shneyour, Ron Bar-Or +1 more	2017-12-05	$41,374,000
9530199	Technique for measuring overlay between layers of a multilayer structure	Yakov Weinberg, Ishai Schwarzband, Roman Kris, Itay Zauer, Ran Goldman +3 more	2016-12-27	$14,994,000
9383196	System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensions	Yuval Yahav	2016-07-05	$10,411,000
9297692	System and method for inspecting a sample using landing lens	Yoram Uziel, Alon Litman, Ron Naftali, Juergen Frosien	2016-03-29	$6,414,000
9046475	High electron energy based overlay error measurement methods and systems	Moshe Langer, Ram Peltinov, Yoram Uziel, Ori Shoval	2015-06-02	$16,225,000

Ofer Adan — 10 Patents

Issued Patents All Time

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