Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824852 | CD-SEM technique for wafers fabrication control | Roman Kris, Yakov Weinberg, Yan Ivanchenko, Ishai Schwarzband, Dan Lange +3 more | 2017-11-21 |
| 9046475 | High electron energy based overlay error measurement methods and systems | Moshe Langer, Ofer Adan, Ram Peltinov, Yoram Uziel | 2015-06-02 |