Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11908716 | Image-based in-situ process monitoring | Guoheng Zhao, Venkatakaushik Voleti, Todd Egan, Kyle Tantiwong, Andreas Schulze +1 more | 2024-02-20 |
| 10886155 | Optical stack deposition and on-board metrology | Mingwei Zhu, Zihao Yang, Nag B. Patibandla, Daniel Lee Diehl, Yong Cao +5 more | 2021-01-05 |
| 10049904 | Method and system for moving a substrate | Ofer Adan, Israel Avneri, Yoram Uziel, Igor Krivts (Krayvitz) | 2018-08-14 |