Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394655 | Subsurface alignment metrology system for packaging applications | Keith Wells, Mehdi Vaez-Iravani | 2025-08-19 |
| 12222659 | Metrology system for packaging applications | Mehdi Vaez-Iravani | 2025-02-11 |
| 12211717 | Spatial pattern loading measurement with imaging metrology | Eric Ng, Edward W. Budiarto, Mehdi Vaez-Iravani, Todd Egan | 2025-01-28 |
| 11908716 | Image-based in-situ process monitoring | Guoheng Zhao, Todd Egan, Kyle Tantiwong, Andreas Schulze, Niranjan Ramchandra Khasgiwale +1 more | 2024-02-20 |
| 11333874 | Three-dimensional imaging using swept, confocally aligned planar excitation with a Powell lens and/or deliberate misalignment | Elizabeth M.C. HILLMAN | 2022-05-17 |
| 10955652 | Three-dimensional imaging using swept, confocally aligned planar excitation with a Powell lens and/or deliberate misalignment | Elizabeth M.C. HILLMAN | 2021-03-23 |
| 10908088 | SCAPE microscopy with phase modulating element and image reconstruction | Elizabeth M.C. HILLMAN | 2021-02-02 |