Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362131 | Method for inspecting a specimen and charged particle beam device | Pieter Kruit, Ron Naftali, Jürgen Frosien, Ralf Schmid, Benjamin John Cook +1 more | 2025-07-15 |
| 11495433 | Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimen | Benjamin John Cook, Dieter Winkler, Markus Thomann, Thomas Kemen | 2022-11-08 |
| 10784070 | Charged particle beam device, field curvature corrector, and methods of operating a charged particle beam device | Thomas Kemen, Benjamin John Cook | 2020-09-22 |