| 12362131 |
Method for inspecting a specimen and charged particle beam device |
Pieter Kruit, Ron Naftali, Jürgen Frosien, Benjamin John Cook, Roman Barday +1 more |
2025-07-15 |
|
| 11552536 |
Electric motor and inverter assembly |
Tao Zhu, Yanlin Li, Xinhua Liu, Takashi Shigematsu, Heinz-Bernd Haiser +2 more |
2023-01-10 |
$7,408,000 |
| 10748743 |
Device and method for operating a charged particle device with multiple beamlets |
Benjamin John Cook, Dieter Winkler |
2020-08-18 |
|
| 9376087 |
Front module of a motor vehicle |
Markus Keller, Tobias Hegedusch, Peter Reutlinger, Michael Zehender |
2016-06-28 |
|
| 8297680 |
Device for reinforcement |
— |
2012-10-30 |
|
| 8222911 |
Light-assisted testing of an optoelectronic module |
Bernhard Mueller, Matthias Brunner |
2012-07-17 |
$13,316,000 |
| 8020906 |
Easily mountable motor vehicle crash apparatus |
Martin Sedlar |
2011-09-20 |
|
| 8009299 |
Method for beam calibration and usage of a calibration body |
Matthias Brunner, Bernhard Mueller, Axel Wenzel |
2011-08-30 |
$11,098,000 |
| 7973546 |
In-line electron beam test system |
Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner +3 more |
2011-07-05 |
$5,297,000 |
| 7847566 |
Configurable prober for TFT LCD array test |
Matthias Brunner, Shinichi Kurita, Fayez (Frank) E. Abboud, Benjamin M. Johnston, Paul Bocian +1 more |
2010-12-07 |
$3,240,000 |
| 7786742 |
Prober for electronic device testing on large area substrates |
Sriram Krishnaswami, Matthias Brunner, William Beaton, Yong Liu, Benjamin M. Johnston +2 more |
2010-08-31 |
$13,689,000 |
| 7746088 |
In-line electron beam test system |
Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner +3 more |
2010-06-29 |
$7,165,000 |
| 7569818 |
Method to reduce cross talk in a multi column e-beam test system |
Thomas Schwedes |
2009-08-04 |
$13,023,000 |
| 7535238 |
In-line electron beam test system |
Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Matthias Brunner +3 more |
2009-05-19 |
$24,403,000 |
| 7375505 |
Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
Matthias Brunner |
2008-05-20 |
$13,768,000 |
| 7355418 |
Configurable prober for TFT LCD array test |
Matthias Brunner, Shinichi Kurita, Fayez E. Abboud, Benjamin M. Johnston, Paul Bocian +1 more |
2008-04-08 |
$17,034,000 |
| 7319335 |
Configurable prober for TFT LCD array testing |
Matthias Brunner, Shinichi Kurita, Fayez (Frank) E. Abboud, Benjamin M. Johnston, Paul Bocian +1 more |
2008-01-15 |
$53,160,000 |
| 7256606 |
Method for testing pixels for LCD TFT displays |
Axel Wenzel, Matthias Brunner |
2007-08-14 |
$16,337,000 |
| 7105833 |
Deflection system for a particle beam device |
Matthias Brunner |
2006-09-12 |
|
| 7009116 |
Contact device and a process to facilitate contact of power electronics components and an assembly that consists of one or several power electronics components |
Marco Schmidt |
2006-03-07 |
|
| 6945611 |
Braking system for vehicle provided with ABS or an anti-skid protection system |
Reinhold Mayer |
2005-09-20 |
|
| 6905180 |
Method and device for monitoring the effectiveness of vehicle braking systems |
Reinhold Mayer |
2005-06-14 |
|
| 6894411 |
Electric machine designed as a starter, generator or starter-generator for a motor vehicle |
Marco Schmidt |
2005-05-17 |
|
| 6808237 |
Method and device for controlling the supply of a pressure medium on rail vehicles (compressor management) |
Stefan Reinicke |
2004-10-26 |
|
| 6743298 |
Method for cleaning vehicle windows |
— |
2004-06-01 |
|
