BJ

Benjamin M. Johnston

Applied Materials: 21 patents #612 of 7,310Top 9%
Overall (All Time): #204,610 of 4,157,543Top 5%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12061422 Method for fast loading substrates in a flat panel tool Preston Fung, Sean Screws, Cheuk Ming LEE, Jae Myung YOO 2024-08-13
11009801 Dynamic cooling control for thermal stabilization for lithography system David Michael CORRIVEAU, Cheuk Ming LEE, Jae Myung YOO, WeiMin Tao, Antoine P. Manens 2021-05-18
10901328 Method for fast loading substrates in a flat panel tool Preston Fung, Sean Screws, Cheuk Ming LEE, Jae Myung YOO 2021-01-26
10788762 Dynamic cooling control for thermal stabilization for lithography system David Michael CORRIVEAU, Cheuk Ming LEE, Jae Myung YOO, WeiMin Tao, Antoine P. Manens 2020-09-29
10379450 Apparatus and methods for on-the-fly digital exposure image data modification Thomas Laidig, Jang Fung Chen, John M. White 2019-08-13
10036966 Environmental control of systems for photolithography process John M. White, Thomas Laidig 2018-07-31
10031427 Methods and apparatus for vibration damping stage Jeffrey Kaskey, Thomas Laidig 2018-07-24
9927723 Apparatus and methods for on-the-fly digital exposure image data modification Thomas Laidig, Jang Fung Chen, John M. White 2018-03-27
9820372 Segmented antenna assembly 2017-11-14
9315900 Isolation of microwave sources through bellows Shinichi Kurita 2016-04-19
7973546 In-line electron beam test system Fayez E. Abboud, Sriram Krishnaswami, Hung T. Nguyen, Matthias Brunner, Ralf Schmid +3 more 2011-07-05
7919972 Integrated substrate transfer module Shinichi Kurita, Emanuel Beer, Hung T. Nguyen, Fayez E. Abboud 2011-04-05
7847566 Configurable prober for TFT LCD array test Matthias Brunner, Shinichi Kurita, Ralf Schmid, Fayez (Frank) E. Abboud, Paul Bocian +1 more 2010-12-07
7786742 Prober for electronic device testing on large area substrates Sriram Krishnaswami, Matthias Brunner, William Beaton, Yong Liu, Hung T. Nguyen +2 more 2010-08-31
7746088 In-line electron beam test system Fayez E. Abboud, Sriram Krishnaswami, Hung T. Nguyen, Matthias Brunner, Ralf Schmid +3 more 2010-06-29
7602199 Mini-prober for TFT-LCD testing Sriram Krishnaswami, Hung T. Nguyen, Matthias Brunner, Yong Liu 2009-10-13
7535238 In-line electron beam test system Fayez E. Abboud, Sriram Krishnaswami, Hung T. Nguyen, Matthias Brunner, Ralf Schmid +3 more 2009-05-19
7355418 Configurable prober for TFT LCD array test Matthias Brunner, Shinichi Kurita, Ralf Schmid, Fayez E. Abboud, Paul Bocian +1 more 2008-04-08
7330021 Integrated substrate transfer module Shinichi Kurita, Emanuel Beer, Hung T. Nguyen, Fayez E. Abboud 2008-02-12
7319335 Configurable prober for TFT LCD array testing Matthias Brunner, Shinichi Kurita, Ralf Schmid, Fayez (Frank) E. Abboud, Paul Bocian +1 more 2008-01-15
6833717 Electron beam test system with integrated substrate transfer module Shinichi Kurita, Emanuel Beer, Hung T. Nguyen 2004-12-21