Issued Patents All Time
Showing 25 most recent of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11161316 | Method for pressing a workpiece with a predetermined pressing force | Tobias Glueck, August Gruendl, Andreas Kugi, Josef Meingassner, Michael Pauditz | 2021-11-02 |
| 10329588 | Device for the biomethanation of H2 and CO2 | — | 2019-06-25 |
| 9366696 | Roll to roll tester and method of testing flexible substrates roll to roll | — | 2016-06-14 |
| 8220825 | Method and device for fastening an airbag in a motor vehicle | Frank Bonarens, Dietmar Breidert, Benjamin De Buysscher, Johannes Diehl, Mathias Grube +1 more | 2012-07-17 |
| 8222911 | Light-assisted testing of an optoelectronic module | Bernhard Mueller, Ralf Schmid | 2012-07-17 |
| 8208114 | Drive apparatus with improved testing properties | — | 2012-06-26 |
| 8115506 | Localization of driver failures within liquid crystal displays | — | 2012-02-14 |
| 8009299 | Method for beam calibration and usage of a calibration body | Ralf Schmid, Bernhard Mueller, Axel Wenzel | 2011-08-30 |
| 7973546 | In-line electron beam test system | Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Ralf Schmid +3 more | 2011-07-05 |
| 7847566 | Configurable prober for TFT LCD array test | Shinichi Kurita, Ralf Schmid, Fayez (Frank) E. Abboud, Benjamin M. Johnston, Paul Bocian +1 more | 2010-12-07 |
| 7786742 | Prober for electronic device testing on large area substrates | Sriram Krishnaswami, William Beaton, Yong Liu, Benjamin M. Johnston, Hung T. Nguyen +2 more | 2010-08-31 |
| 7746088 | In-line electron beam test system | Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Ralf Schmid +3 more | 2010-06-29 |
| 7602199 | Mini-prober for TFT-LCD testing | Benjamin M. Johnston, Sriram Krishnaswami, Hung T. Nguyen, Yong Liu | 2009-10-13 |
| 7535238 | In-line electron beam test system | Fayez E. Abboud, Sriram Krishnaswami, Benjamin M. Johnston, Hung T. Nguyen, Ralf Schmid +3 more | 2009-05-19 |
| 7474108 | Apparatus and method for contacting of test objects | — | 2009-01-06 |
| 7375505 | Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method | Ralf Schmid | 2008-05-20 |
| 7372250 | Methods and apparatus for determining a position of a substrate relative to a support stage | Shinichi Kurita, Emanuel Beer, Edgar Kehrberg | 2008-05-13 |
| 7353929 | Clutch lever arrangement | Joachim Lindner | 2008-04-08 |
| 7355418 | Configurable prober for TFT LCD array test | Shinichi Kurita, Ralf Schmid, Fayez E. Abboud, Benjamin M. Johnston, Paul Bocian +1 more | 2008-04-08 |
| 7319335 | Configurable prober for TFT LCD array testing | Shinichi Kurita, Ralf Schmid, Fayez (Frank) E. Abboud, Benjamin M. Johnston, Paul Bocian +1 more | 2008-01-15 |
| 7317325 | Line short localization in LCD pixel arrays | Young Seop Ko | 2008-01-08 |
| 7256606 | Method for testing pixels for LCD TFT displays | Axel Wenzel, Ralf Schmid | 2007-08-14 |
| 7135875 | Apparatus and method for contacting of test objects | — | 2006-11-14 |
| 7129694 | Large substrate test system | Shinichi Kurita, Wendell T. Blonigan, Edgar Kehrberg | 2006-10-31 |
| 7105833 | Deflection system for a particle beam device | Ralf Schmid | 2006-09-12 |