MB

Matthias Brunner

Applied Materials: 22 patents #582 of 7,310Top 8%
SA Siemens Aktiengesellschaft: 12 patents #782 of 22,248Top 4%
ZA Zf Friedrichshafen Ag: 1 patents #1,366 of 2,695Top 55%
ZA Zf Sachs Ag: 1 patents #81 of 172Top 50%
General Motors: 1 patents #9,361 of 18,328Top 55%
SG Stiwa Holding Gmbh: 1 patents #2 of 11Top 20%
PA Passavant-Werke Ag: 1 patents #6 of 20Top 30%
📍 Poing, DE: #4 of 166 inventorsTop 3%
Overall (All Time): #70,619 of 4,157,543Top 2%
43
Patents All Time

Issued Patents All Time

Showing 26–43 of 43 patents

Patent #TitleCo-InventorsDate
7075323 Large substrate test system Shinichi Kurita, Wendell T. Blonigan, Edgar Kehrberg 2006-07-11
6845856 Release mechanism with a device for compensating for inaccuracies in a friction clutch of a motor vehicle Herbert Voit 2005-01-25
6730906 Method and apparatus for testing a substrate Ralf Schmid 2004-05-04
6465795 Charge neutralization of electron beam systems Juan R. Madonado, Lee H. Veneklasen, Ralf Schmid 2002-10-15
5834773 Method and apparatus for testing the function of microstructure elements Hans-Peter Feuerbaum, Jürgen Frosien 1998-11-10
5414374 Method for particle beam testing of substrates for liquid crystal displays (LCD) Reinhold Schmitt 1995-05-09
5373233 Method for the recognition of testing errors in the test of microwirings Ralf Schmid 1994-12-13
5371459 Method for particle beam testing of substrates for liquid crystal displays using parasitic currents Reinhold Schmitt 1994-12-06
5268638 "Method for particle beam testing of substrates for liquid crystal displays ""LCD""" Reinhold Schmitt 1993-12-07
5258706 Method for the recognition of testing errors in the test of microwirings Ralf Schmid 1993-11-02
5190672 Method for thermal disposal of sewage sludge Hubert Coenen, Helmut Hubert, Friedhelm Bultmann 1993-03-02
5045783 Method for testing a printed circuit board with a particle probe Hermann Wessely 1991-09-03
4985681 Particle beam measuring method for non-contact testing of interconnect networks Juergen Frosien, Reinhold Schmitt, Burkhard Lischke 1991-01-15
4983833 Device for the detecting of charged secondary particles Ralf Schmid, Michael Regula 1991-01-08
4954705 Method for examining a specimen in a particle beam instrument Burkhard Lischke 1990-09-04
4841242 Method for testing conductor networks 1989-06-20
4831267 Detector for charged particles 1989-05-16
4748407 Method and apparatus for measuring time dependent signals with a particle probe Reinhold Schmitt, Dieter Winkler 1988-05-31