Issued Patents All Time
Showing 1–25 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8203119 | Charged particle beam device with retarding field analyzer | Ralf Degenhardt, Dirk Hambach, Walter Kögler, Harry Munack, Carlo Salvesen | 2012-06-19 |
| 7652263 | Focussing lens for charged particle beams | — | 2010-01-26 |
| 7638777 | Imaging system with multi source array | Jürgen Frosien, Uli Hoffmann, Dieter Winkler, Pavel Adamec | 2009-12-29 |
| 7586093 | Apparatus and method for inspecting a sample of a specimen by means of an electron beam | — | 2009-09-08 |
| 7274018 | Charged particle beam apparatus and method for operating the same | Pavel Adamec, Ralf Degenhardt, Harry Munack, Dieter Winkler | 2007-09-25 |
| 7075092 | Charged particle beam microscope with minicolumn | Dieter Winkler, Joseph Bach | 2006-07-11 |
| 7045781 | Charged particle beam apparatus and method for operating the same | Pavel Adamec, Ralf Degenhardt, Harry Munack, Dieter Winkler | 2006-05-16 |
| 6943349 | Multi beam charged particle device | Pavel Adamec, Ralf Degenhardt, Harry Munack, Dieter Winkler | 2005-09-13 |
| 6936817 | Optical column for charged particle beam device | — | 2005-08-30 |
| 6740889 | Charged particle beam microscope with minicolumn | Dieter Winkler, Joseph Bach | 2004-05-25 |
| 6730907 | Charged particle device | Dieter Winkler, Dror Kella | 2004-05-04 |
| 6576908 | Beam column for charged particle beam device | Dieter Winkler, Ralf Degenhardt | 2003-06-10 |
| 6555815 | Apparatus and method for examining specimen with a charged particle beam | Dieter Winkler | 2003-04-29 |
| 6555824 | Method and device for focusing a charged particle beam | Dieter Winkler | 2003-04-29 |
| 5834773 | Method and apparatus for testing the function of microstructure elements | Matthias Brunner, Jürgen Frosien | 1998-11-10 |
| 5780859 | Electrostatic-magnetic lens arrangement | Jürgen Frosien, Koshi Ueda, Toshimichi Iwai, Gerald Schonecker | 1998-07-14 |
| 5422486 | Scanning electron beam device | Karl Herrmann, Steffen Beck, Jürgen Frosien, Andreas Benez, Stefan Lanio +1 more | 1995-06-06 |
| 5329125 | Device for corpuscular-optical examination and/or processing of material samples | — | 1994-07-12 |
| 5041724 | Method of operating an electron beam measuring device | Jürgen Frosien | 1991-08-20 |
| 4831266 | Detector objective for particle beam apparatus | Juergen Frosien | 1989-05-16 |
| 4812651 | Spectrometer objective for particle beam measuring instruments | Juergen Frosien | 1989-03-14 |
| 4808821 | Spectrometer objective for electron beam mensuration techniques | Juergen Frosien | 1989-02-28 |
| 4733176 | Method and apparatus for locating defects in an electrical circuit with a light beam | — | 1988-03-22 |
| 4713543 | Scanning particle microscope | Juergen Frosien, Rainer Spehr | 1987-12-15 |
| 4686466 | Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof | Peter Fazekas | 1987-08-11 |