AB

Andreas Benez

IM Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh: 1 patents #32 of 73Top 45%
Overall (All Time): #3,772,514 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5422486 Scanning electron beam device Karl Herrmann, Steffen Beck, Hans-Peter Feuerbaum, Jürgen Frosien, Stefan Lanio +1 more 1995-06-06