HF

Hans-Peter Feuerbaum

SA Siemens Aktiengesellschaft: 22 patents #259 of 22,248Top 2%
Applied Materials: 5 patents #2,165 of 7,310Top 30%
Overall (All Time): #73,932 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 26–42 of 42 patents

Patent #TitleCo-InventorsDate
4683376 Opposing field spectrometer for electron beam mensuration technology 1987-07-28
4675602 Method for automatically setting an operating point given signal curve measurements with a particle beam measuring apparatus Peter Fazekas 1987-06-23
4651003 Particle-accelerating electrode 1987-03-17
4539477 Method and apparatus for suppressing disturbances in the measurement of signals with a particle probe Reinhold Schmitt 1985-09-03
4514682 Secondary electron spectrometer for measuring voltages on a sample utilizing an electron probe 1985-04-30
4486660 Electron beam testing device for stroboscopic measurement of high-frequency, periodic events 1984-12-04
4471302 Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe Peter Fazekas, Ulrich Knauer, Johann Otto 1984-09-11
4460866 Method for measuring resistances and capacitances of electronic components Ulrich Knauer 1984-07-17
4413181 Arrangement for stroboscopic potential measurements with an electron beam testing device 1983-11-01
4412191 Method and arrangement for quantitative potential measurements on surface-wave filters Gerald Tobolka 1983-10-25
4296372 Techniques for impressing a voltage with an electron beam 1981-10-20
4292519 Device for contact-free potential measurements 1981-09-29
4277679 Apparatus and method for contact-free potential measurements of an electronic composition 1981-07-07
4241259 Scanning electron microscope Johann Otto 1980-12-23
4223220 Method for electronically imaging the potential distribution in an electronic component and arrangement for implementing the method 1980-09-16
4220853 Method for the contactless measurement of the potential waveform in an electronic component and arrangement for implementing the method Eckhard Wolfgang 1980-09-02
4220854 Method for the contactless measurement of the potential waveform in an electronic component and apparatus for implementing the method 1980-09-02