Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7508290 | Inductive component and use of said component | Martin Honsberg-Riedl, Eckhard Wolfgang | 2009-03-24 |
| 4963823 | Electron beam measuring instrument | Erich Plies | 1990-10-16 |
| 4902966 | Method and apparatus for operating a scanning microscope | Hans-Detlef Brust | 1990-02-20 |
| 4812748 | Method and apparatus for operating a scanning microscope | Hans-Detlef Brust | 1989-03-14 |
| 4780669 | Method and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuit | Hans-Detlef Brust | 1988-10-25 |
| 4689555 | Method for the determination of points on a specimen carrying a specific signal frequency by use of a scanning microscope | Hans-Detlef Brust | 1987-08-25 |
| 4677351 | Circuit for preventing burn-in spots on the picture screen of a visual display | Hans-Detlef Brust | 1987-06-30 |
| 4640626 | Method and apparatus for localizing weak points within an electrical circuit | Ralf Schmid, Daniela Bernklau, Erwin Knapek | 1987-02-03 |
| 4611119 | Method of emphasizing a subject area in a scanning microscope | Peter Fazekas | 1986-09-09 |
| 4471302 | Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe | Peter Fazekas, Hans-Peter Feuerbaum, Ulrich Knauer | 1984-09-11 |
| 4241259 | Scanning electron microscope | Hans-Peter Feuerbaum | 1980-12-23 |