Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6580073 | Monochromator for charged particles | Jan Bärtle, Armin Huber | 2003-06-17 |
| 5661400 | Antenna for nuclear magnetic resonance tomography | Alejandro Valenzuela | 1997-08-26 |
| 5616920 | Apparatus for removing ions from an electron beam | — | 1997-04-01 |
| 5247392 | Objective lens for producing a radiation focus in the inside of a specimen | — | 1993-09-21 |
| 5146090 | Particle beam apparatus having an immersion lens arranged in an intermediate image of the beam | — | 1992-09-08 |
| 5030829 | Method and apparatus for investigating latch-up propagation in complementary-metal-oxide-semiconductor (CMOS) circuits | Joerg Quincke | 1991-07-09 |
| 5012100 | Method and apparatus for investigating the latch-up propagation in complementary-metal-oxide semiconductor (CMOS) circuits | Joerg Quincke | 1991-04-30 |
| 4963823 | Electron beam measuring instrument | Johann Otto | 1990-10-16 |
| 4788495 | Method for the indirect identification of the intensity distribution of particle beam pulses generated in a particle beam measuring instrument | — | 1988-11-29 |
| 4785176 | Electrostatic-magnetic lens for particle beam apparatus | Juergen Frosien | 1988-11-15 |
| 4769543 | Spectrometer lens for particle beam apparatus | — | 1988-09-06 |
| 4748324 | Electrostatic opposing field spectrometer for electron beam test methods | Wilhelm Argyo | 1988-05-31 |
| 4728790 | Low-abberation spectrometer objective with high secondary electron acceptance | — | 1988-03-01 |
| 4684808 | Scanning system for a particle beam scanning apparatus | Gerd Kuck | 1987-08-04 |
| 4629899 | Deflection lens system for generating a beam of neutral particles of variable cross section | — | 1986-12-16 |
| 4551625 | Spectrometer objective for particle beam measurement technique | Burkhard Lischke | 1985-11-05 |
| 4540885 | Spectrometer objective having parallel objective fields and spectrometer fields for the potential measuring technique | Reinhard Weyl, Burkhard Lischke | 1985-09-10 |
| 4514638 | Electron-optical system with variable-shaped beam for generating and measuring microstructures | Burkhard Lischke, Juergen Frosien, Klaus Anger | 1985-04-30 |
| 4507559 | Deflection structure for a corpuscular beam blanking system and method for operating same | — | 1985-03-26 |
| 4464571 | Opposing field spectrometer for electron beam mensuration technology | — | 1984-08-07 |
| 4439685 | Corpuscular beam blanking system | — | 1984-03-27 |
| 4393308 | High current electron source | Klaus Anger, Juergen Frosien, Burkhard Lischke, Klaus Tonar | 1983-07-12 |