Koshi Ueda — 7 Patents at Advantest

Koshi Ueda has been granted 7 US patents while listed as an inventor at Advantest. The first was granted in 1996 and the most recent in April 1999. Koshi Ueda ranks #680,018 of 4,157,543 US inventors in our database (top 16.4%). Patent records list Koshi Ueda in Machida, JP.

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Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
5895917	Detector objective lens	Toshimichi Iwai, Gerald Schonecker, Jürgen Frosien	1999-04-20
5780859	Electrostatic-magnetic lens arrangement	Hans-Peter Feuerbaum, Jürgen Frosien, Toshimichi Iwai, Gerald Schonecker	1998-07-14
5640539	IC analysis system having charged particle beam apparatus for improved contrast image	Akira Goishi, Masayuki Kurihara	1997-06-17
5633595	IC analysis system and electron beam probe system and fault isolation method therefor	Akira Goishi, Masayuki Kuribara	1997-05-27
5592099	IC tester joined with ion beam tester and the detection method of the failure part of IC	Masayuki Kuribara, Akira Goishi	1997-01-07
5589780	IC Analysis system and electron beam probe system and fault isolation method therefor	Akira Goishi, Masayuki Kuribara	1996-12-31
5528156	IC analysis system and electron beam probe system and fault isolation method therefor	Akira Goishi, Masayuki Kuribara	1996-06-18

Koshi Ueda — 7 Patents

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