Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method to reduce cross talk in a multi column e-beam test system

Method to reduce cross talk in a multi column e-beam test system

US Patent 7569818 · Granted Aug 4, 2009

Estimated economic value: $13,023,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for inspecting a specimen and charged particle beam device2025
Electric motor and inverter assembly2023
Device and method for operating a charged particle device with multiple beamlets2020
Front module of a motor vehicle2016
Device for reinforcement2012
Light-assisted testing of an optoelectronic module2012
Easily mountable motor vehicle crash apparatus2011
Method for beam calibration and usage of a calibration body2011
In-line electron beam test system2011
Configurable prober for TFT LCD array test2010
Prober for electronic device testing on large area substrates2010
In-line electron beam test system2010