Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10421125 | Controlling an intensity profile of an energy beam in additive manufacturing based on travel direction or velocity | Hou T. Ng, Ron Naftali | 2019-09-24 |
| 10307822 | Controlling an intensity profile of an energy beam with a deformable mirror in additive manufacturing | Hou T. Ng, Ron Naftali | 2019-06-04 |
| 9915621 | Extreme ultraviolet (EUV) substrate inspection system with simplified optics and method of manufacturing thereof | Majeed A. Foad, Christopher Dennis Bencher, John Christopher Moran | 2018-03-13 |
| 7602197 | High current electron beam inspection | Alexander Kadyshevitch, Dmitry Shur | 2009-10-13 |
| 7253645 | Detection of defects in patterned substrates | Chiwoei Wayne Lo | 2007-08-07 |
| 6914441 | Detection of defects in patterned substrates | Chiwoei Wayne Lo | 2005-07-05 |
| 6539106 | Feature-based defect detection | Harry Gallarda, Chiwoei Wayne Lo, Adam Rhoads | 2003-03-25 |
| 6518571 | Through-the-substrate investigation of flip-chip IC's | James Henry Brown | 2003-02-11 |
| 6509750 | Apparatus for detecting defects in patterned substrates | Chiwoei Wayne Lo | 2003-01-21 |
| 6504393 | Methods and apparatus for testing semiconductor and integrated circuit structures | Chiwoei Wayne Lo, Mariel Stoops | 2003-01-07 |
| 6252412 | Method of detecting defects in patterned substrates | Chiwoei Wayne Lo | 2001-06-26 |
| 6225626 | Through-the-substrate investigation of flip chip IC's | James Henry Brown | 2001-05-01 |
| 6091249 | Method and apparatus for detecting defects in wafers | Chiwoei Wayne Lo, Luis Camilo Orjuela, Li Wang | 2000-07-18 |
| 5959458 | Method and apparatus for measuring electrical waveforms using atomic force microscopy | — | 1999-09-28 |
| 5821549 | Through-the-substrate investigation of flip-chip IC's | James Henry Brown | 1998-10-13 |
| 5675499 | Optimal probe point placement | William T. Lee, Ronny Soetarman | 1997-10-07 |
| 5616921 | Self-masking FIB milling | Douglas K. Masnaghetti, Hongyu Ximen | 1997-04-01 |
| 5530372 | Method of probing a net of an IC at an optimal probe-point | William T. Lee, Ronny Soetarman | 1996-06-25 |
| 5401972 | Layout overlay for FIB operations | Douglas K. Masnaghetti | 1995-03-28 |
| 5357116 | Focused ion beam processing with charge control | Thomas M. Trexler | 1994-10-18 |
| 5144225 | Methods and apparatus for acquiring data from intermittently failing circuits | Neil Richardson | 1992-09-01 |
| 5140164 | IC modification with focused ion beam system | Neil Richardson, Douglas K. Masnaghetti | 1992-08-18 |
| 4510384 | Automatic focusing device with frequency weighted amplification | James B. Grimbleby | 1985-04-09 |