Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9165742 | Inspection site preparation | Richard R. Simmons, Mark A. McCord, Fred E. Stanke, Scott A. Young, Christopher Sears | 2015-10-20 |
| 7792351 | Defect review using image segmentation | Gabor Toth | 2010-09-07 |
| 7684609 | Defect review using image segmentation | Gabor Toth | 2010-03-23 |
| 7550744 | Chamberless substrate handling | George R. Koch | 2009-06-23 |
| 7550743 | Chamberless substrate handling | — | 2009-06-23 |
| 7288774 | Transverse magnetic field voltage isolator | George R. Koch, James D. Olson, Jeffery Scott Coffer | 2007-10-30 |
| 7276690 | Method and system for e-beam scanning | Gian Francesco Lorusso, Luca Grella, Amir Azordegan | 2007-10-02 |
| 7247849 | Automated focusing of electron image | Gabor Toth, Varoujan Chakarian | 2007-07-24 |
| 7164139 | Wien filter with reduced chromatic aberration | Gabor Toth, Jeffrey Keister, Eric Munro | 2007-01-16 |
| 7141791 | Apparatus and method for E-beam dark field imaging | Eric Munro, Gabor Toth, Jeffrey Keister | 2006-11-28 |
| 7041976 | Automated focusing of electron image | Mark A. Neil, Gian Francesco Lorusso, Gabor Toth, Varoujan Chakarian | 2006-05-09 |
| 6815675 | Method and system for e-beam scanning | Gian Francesco Lorusso, Luca Grella, Amir Azordegan | 2004-11-09 |
| 6784425 | Energy filter multiplexing | Gian Francesco Lorusso, Laurence S. Hordon, Sander Josef Gubbens | 2004-08-31 |
| 6710354 | Scanning electron microscope architecture and related material handling system | George R. Koch | 2004-03-23 |
| 6570154 | Scanning electron beam microscope | Stefano E. Concina, Stanley Sun, Waiman Ng, David L. Adler | 2003-05-27 |
| 6066849 | Scanning electron beam microscope | Stefano E. Concina, Stanley Sun, Waiman Ng, David L. Adler | 2000-05-23 |
| 5700526 | Insulator deposition using focused ion beam | Hongyu Ximen, Michael A. Cecere | 1997-12-23 |
| 5616921 | Self-masking FIB milling | Christopher G. Talbot, Hongyu Ximen | 1997-04-01 |
| 5401972 | Layout overlay for FIB operations | Christopher G. Talbot | 1995-03-28 |
| 5210487 | Double-gated integrating scheme for electron beam tester | Hitoshi Takahashi, Neil Richardson | 1993-05-11 |
| 5140164 | IC modification with focused ion beam system | Christopher G. Talbot, Neil Richardson | 1992-08-18 |