Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861671 | Method and system for focus adjustment of a multi-beam scanning electron microscopy system | Doug K. Masnaghetti, Scott A. Young, Mark A. McCord, Rainer Knippelmeyer | 2020-12-08 |
| 10460905 | Backscattered electrons (BSE) imaging using multi-beam tools | Mark A. McCord, Doug K. Masnaghetti, Rainer Knippelmeyer | 2019-10-29 |
| 10366862 | Method and system for noise mitigation in a multi-beam scanning electron microscopy system | Doug K. Masnaghetti, Mark A. McCord, Rainer Knippelmeyer | 2019-07-30 |
| 10325753 | Method and system for focus adjustment of a multi-beam scanning electron microscopy system | Doug K. Masnaghetti, Scott A. Young, Mark A. McCord, Rainer Knippelmeyer | 2019-06-18 |
| 10192716 | Multi-beam dark field imaging | Doug K. Masnaghetti, Mark A. McCord, Rainer Knippelmeyer | 2019-01-29 |
| 9165742 | Inspection site preparation | Douglas K. Masnaghetti, Mark A. McCord, Fred E. Stanke, Scott A. Young, Christopher Sears | 2015-10-20 |
| 5578821 | Electron beam inspection system and method | Dan Meisberger, Alan D. Brodie, Anil Desai, Dennis G. Emge, Zhong-Wei Chen +7 more | 1996-11-26 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |
| 4639587 | Automatic focusing system for a microscope | Curt H. Chadwick, Art Shulenberger, John S. Taylor | 1987-01-27 |
| 4292513 | Heat detector circuit | Harvey A. Thompson | 1981-09-29 |