Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5578821 | Electron beam inspection system and method | Alan D. Brodie, Anil Desai, Dennis G. Emge, Zhong-Wei Chen, Richard R. Simmons +7 more | 1996-11-26 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5578821 | Electron beam inspection system and method | Alan D. Brodie, Anil Desai, Dennis G. Emge, Zhong-Wei Chen, Richard R. Simmons +7 more | 1996-11-26 |