Issued Patents All Time
Showing 1–25 of 53 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354833 | Multiple landing energy scanning electron microscopy systems and methods | Wei Fang, Weiming Ren | 2025-07-08 |
| 12347643 | Multiple charged-particle beam apparatus and methods of operating the same using movable lenses | Weiming Ren, Xuedong Liu, Xuerang Hu | 2025-07-01 |
| 12308205 | Beam current adjustment for charged-particle inspection system | Wei Fang | 2025-05-20 |
| 12278081 | System and method for alignment of secondary beams in multi-beam inspection apparatus | Qingpo Xi, Xuerang Hu, Xuedong Liu, Weiming Ren | 2025-04-15 |
| 12243709 | Apparatus using multiple charged particle beams | Weiming Ren, Xuedong Liu, Xuerang Hu | 2025-03-04 |
| 12237144 | Apparatus using multiple beams of charged particles | Xuerang Hu, Weiming Ren, Xuedong Liu | 2025-02-25 |
| 12211669 | Multiple charged-particle beam apparatus with low crosstalk | Weiming Ren, Zizhou GONG, Xuerang Hu, Xuedong Liu | 2025-01-28 |
| 12196692 | Systems and methods for voltage contrast defect detection | Weiming Ren, Xuedong Liu, Xiaoyu JI, Xiaoxue CHEN, Weimin Zhou +1 more | 2025-01-14 |
| 12040187 | In-die metrology methods and systems for process control | Lingling PU, Wei Fang | 2024-07-16 |
| 11961697 | Apparatus using charged particle beams | Xuerang Hu, Xuedong Liu, Weiming Ren | 2024-04-16 |
| RE49784 | Apparatus of plural charged-particle beams | Weiming Ren, Xuedong Liu, Xuerang Hu | 2024-01-02 |
| 11851215 | Systems and methods for calibrating a synthetic image on an avionic display | Zuowei He, Gang He, Zhiguo Ren | 2023-12-26 |
| 11854765 | Multiple charged-particle beam apparatus and methods | Weiming Ren, Xuedong Liu, Xuerang Hu, Martinus Gerardus Johannes Maria MAASSEN | 2023-12-26 |
| 11815473 | Methods of inspecting samples with multiple beams of charged particles | Kuo-Feng TSENG, Zhonghua Dong, Yixiang Wang | 2023-11-14 |
| 11804356 | Apparatus using multiple beams of charged particles | Xuerang Hu, Weiming Ren, Xuedong Liu | 2023-10-31 |
| 11721521 | Multi-beam inspection apparatus with improved detection performance of signal electrons | Weiming Ren, Xuedong Liu, Xuerang Hu | 2023-08-08 |
| 11688579 | Electron emitter and method of fabricating same | Juying Dou, Zheng Fan, Tzu-Yi Kuo | 2023-06-27 |
| 11676793 | Apparatus of plural charged particle beams | Weiming Ren, Xuedong Liu, Xuerang Hu | 2023-06-13 |
| 11670477 | Apparatus using charged particle beams | Xuerang Hu, Xuedong Liu, Weiming Ren | 2023-06-06 |
| 11655469 | MicroRNAs and methods of their use | Anthony SALEH, Carter Van Waes, Hui Cheng | 2023-05-23 |
| 11594396 | Multi-beam inspection apparatus with single-beam mode | Weiming Ren, Xuedong Liu, Xuerang Hu | 2023-02-28 |
| 11538655 | Multi-beam inspection apparatus | Xuerang Hu, Xuedong Liu, Weiming Ren | 2022-12-27 |
| 11527405 | In-die metrology methods and systems for process control | Lingling PU, Wei Fang | 2022-12-13 |
| 11513087 | Systems and methods for voltage contrast defect detection | Weiming Ren, Xuedong Liu, Xiaoyu JI, Xiaoxue CHEN, Weimin Zhou +1 more | 2022-11-29 |
| 11479365 | Computer vision systems and methods for aiding landing decision | Gang He, Min Wu, Carl A. Dins | 2022-10-25 |