XH

Xuerang Hu

AB Asml Netherlands B.V.: 43 patents #64 of 3,192Top 3%
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📍 San Jose, CA: #992 of 32,062 inventorsTop 4%
🗺 California: #8,171 of 386,348 inventorsTop 3%
Overall (All Time): #55,022 of 4,157,543Top 2%
49
Patents All Time

Issued Patents All Time

Showing 1–25 of 49 patents

Patent #TitleCo-InventorsDate
12424408 Apparatus of plural charged-particle beams Shuai Li, Weiming Ren, Xuedong Liu, Juying Dou, Zhongwei Chen 2025-09-23
12347643 Multiple charged-particle beam apparatus and methods of operating the same using movable lenses Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2025-07-01
12278081 System and method for alignment of secondary beams in multi-beam inspection apparatus Qingpo Xi, Xuedong Liu, Weiming Ren, Zhong-Wei Chen 2025-04-15
12243709 Apparatus using multiple charged particle beams Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2025-03-04
12237143 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Zhongwei Chen 2025-02-25
12237144 Apparatus using multiple beams of charged particles Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2025-02-25
12211669 Multiple charged-particle beam apparatus with low crosstalk Weiming Ren, Zizhou GONG, Xuedong Liu, Zhong-Wei Chen 2025-01-28
12191109 Sample pre-charging methods and apparatuses for charged particle beam inspection Xuedong Liu, Qingpo Xi, Youfei Jiang, Weiming Ren, Zhongwei Chen 2025-01-07
12142453 Multi-beam inspection apparatus Weiming Ren, Qian Zhang, Xuedong Liu 2024-11-12
12080515 Apparatus for multiple charged-particle beams Weiming Ren, Xuedong Liu, Zong-wei Chen 2024-09-03
12033830 Multiple charged-particle beam apparatus with low crosstalk Weiming Ren, Qingpo Xi, Xuedong Liu 2024-07-09
11961697 Apparatus using charged particle beams Xuedong Liu, Weiming Ren, Zhong-Wei Chen 2024-04-16
11961698 Replaceable module for a charged particle apparatus Christiaan OTTEN, Peter-Paul CRANS, Marc Smits, Laura DEL TIN, Christan TEUNISSEN +5 more 2024-04-16
11887807 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Zhongwei Chen 2024-01-30
RE49784 Apparatus of plural charged-particle beams Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2024-01-02
11854765 Multiple charged-particle beam apparatus and methods Weiming Ren, Xuedong Liu, Zhong-Wei Chen, Martinus Gerardus Johannes Maria MAASSEN 2023-12-26
11804356 Apparatus using multiple beams of charged particles Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2023-10-31
11784024 Multi-cell detector for charged particles Joe Wang, Yongxin Wang, Zhongwei Chen 2023-10-10
11721521 Multi-beam inspection apparatus with improved detection performance of signal electrons Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2023-08-08
11705304 Apparatus of plural charged-particle beams Shuai Li, Weiming Ren, Xuedong Liu, Juying Dou, Zhongwei Chen 2023-07-18
11676793 Apparatus of plural charged particle beams Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2023-06-13
11676792 Sample pre-charging methods and apparatuses for charged particle beam inspection Xuedong Liu, Qingpo Xi, Youfei Jiang, Weiming Ren, Zhongwei Chen 2023-06-13
11670477 Apparatus using charged particle beams Xuedong Liu, Weiming Ren, Zhong-Wei Chen 2023-06-06
11614416 System and method for aligning electron beams in multi-beam inspection apparatus Xinan Luo, Qingpo Xi, Xuedong Liu, Weiming Ren 2023-03-28
11594396 Multi-beam inspection apparatus with single-beam mode Weiming Ren, Xuedong Liu, Zhong-Wei Chen 2023-02-28