Issued Patents All Time
Showing 25 most recent of 101 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12424408 | Apparatus of plural charged-particle beams | Shuai Li, Weiming Ren, Juying Dou, Xuerang Hu, Zhongwei Chen | 2025-09-23 |
| 12347643 | Multiple charged-particle beam apparatus and methods of operating the same using movable lenses | Weiming Ren, Xuerang Hu, Zhong-Wei Chen | 2025-07-01 |
| 12278081 | System and method for alignment of secondary beams in multi-beam inspection apparatus | Qingpo Xi, Xuerang Hu, Weiming Ren, Zhong-Wei Chen | 2025-04-15 |
| 12243709 | Apparatus using multiple charged particle beams | Weiming Ren, Xuerang Hu, Zhong-Wei Chen | 2025-03-04 |
| 12237143 | Apparatus of plural charged-particle beams | Weiming Ren, Xuerang Hu, Zhongwei Chen | 2025-02-25 |
| 12237144 | Apparatus using multiple beams of charged particles | Xuerang Hu, Weiming Ren, Zhong-Wei Chen | 2025-02-25 |
| 12211669 | Multiple charged-particle beam apparatus with low crosstalk | Weiming Ren, Zizhou GONG, Xuerang Hu, Zhong-Wei Chen | 2025-01-28 |
| 12196692 | Systems and methods for voltage contrast defect detection | Weiming Ren, Zhong-Wei Chen, Xiaoyu JI, Xiaoxue CHEN, Weimin Zhou +1 more | 2025-01-14 |
| 12191109 | Sample pre-charging methods and apparatuses for charged particle beam inspection | Qingpo Xi, Youfei Jiang, Weiming Ren, Xuerang Hu, Zhongwei Chen | 2025-01-07 |
| 12165837 | System and method for scanning a sample using multi-beam inspection apparatus | Martinus Gerardus Johannes Maria MAASSEN, Joost Jeroen Ottens, Long Ma, Youfei Jiang, Weihua Yin +1 more | 2024-12-10 |
| 12142455 | Charged particle beam apparatus with multiple detectors and methods for imaging | Weimin Zhou, Xiaoxue CHEN, Xiaoyu JI, Heng Li, Shahedul Hoque +3 more | 2024-11-12 |
| 12142453 | Multi-beam inspection apparatus | Weiming Ren, Qian Zhang, Xuerang Hu | 2024-11-12 |
| 12087541 | Apparatus of plural charged-particle beams | Weiming Ren, Shuai Li, Zhongwei Chen | 2024-09-10 |
| 12085679 | Ultrasound beamforming method and device | Chongchong GUO, Jing Liu, Bo Yang, Lei Li, Muqing Lin +1 more | 2024-09-10 |
| 12080515 | Apparatus for multiple charged-particle beams | Weiming Ren, Xuerang Hu, Zong-wei Chen | 2024-09-03 |
| 12033830 | Multiple charged-particle beam apparatus with low crosstalk | Weiming Ren, Xuerang Hu, Qingpo Xi | 2024-07-09 |
| 11961698 | Replaceable module for a charged particle apparatus | Christiaan OTTEN, Peter-Paul CRANS, Marc Smits, Laura DEL TIN, Christan TEUNISSEN +5 more | 2024-04-16 |
| 11961697 | Apparatus using charged particle beams | Xuerang Hu, Weiming Ren, Zhong-Wei Chen | 2024-04-16 |
| 11948772 | Methods and apparatuses for adjusting beam condition of charged particles | — | 2024-04-02 |
| 11887807 | Apparatus of plural charged-particle beams | Weiming Ren, Xuerang Hu, Zhongwei Chen | 2024-01-30 |
| RE49784 | Apparatus of plural charged-particle beams | Weiming Ren, Xuerang Hu, Zhong-Wei Chen | 2024-01-02 |
| 11854765 | Multiple charged-particle beam apparatus and methods | Weiming Ren, Xuerang Hu, Zhong-Wei Chen, Martinus Gerardus Johannes Maria MAASSEN | 2023-12-26 |
| 11804356 | Apparatus using multiple beams of charged particles | Xuerang Hu, Weiming Ren, Zhong-Wei Chen | 2023-10-31 |
| 11721521 | Multi-beam inspection apparatus with improved detection performance of signal electrons | Weiming Ren, Xuerang Hu, Zhong-Wei Chen | 2023-08-08 |
| 11705304 | Apparatus of plural charged-particle beams | Shuai Li, Weiming Ren, Juying Dou, Xuerang Hu, Zhongwei Chen | 2023-07-18 |