XL

Xuedong Liu

AB Asml Netherlands B.V.: 55 patents #48 of 3,192Top 2%
HM Hermes Microvision: 28 patents #4 of 68Top 6%
UC University of Colorado, A Body Corporate: 4 patents #74 of 1,219Top 7%
L' L'Oreal: 4 patents #560 of 2,221Top 30%
BR Bristol: 3 patents #3 of 34Top 9%
WARF: 2 patents #1,011 of 4,123Top 25%
SC Shenzhen Mindray Bio-Medical Electronics Co.: 2 patents #220 of 677Top 35%
TU Tsinghua University: 1 patents #1,221 of 2,815Top 45%
UC University of Colorado: 1 patents #288 of 930Top 35%
📍 San Jose, CA: #254 of 32,062 inventorsTop 1%
🗺 California: #2,203 of 386,348 inventorsTop 1%
Overall (All Time): #14,058 of 4,157,543Top 1%
101
Patents All Time

Issued Patents All Time

Showing 26–50 of 101 patents

Patent #TitleCo-InventorsDate
11688580 Apparatus of plural charged-particle beams Weiming Ren, Shuai Li, Zhongwei Chen 2023-06-27
11676793 Apparatus of plural charged particle beams Weiming Ren, Xuerang Hu, Zhong-Wei Chen 2023-06-13
11676792 Sample pre-charging methods and apparatuses for charged particle beam inspection Qingpo Xi, Youfei Jiang, Weiming Ren, Xuerang Hu, Zhongwei Chen 2023-06-13
11670477 Apparatus using charged particle beams Xuerang Hu, Weiming Ren, Zhong-Wei Chen 2023-06-06
11614416 System and method for aligning electron beams in multi-beam inspection apparatus Xuerang Hu, Xinan Luo, Qingpo Xi, Weiming Ren 2023-03-28
11594396 Multi-beam inspection apparatus with single-beam mode Weiming Ren, Xuerang Hu, Zhong-Wei Chen 2023-02-28
11587758 Apparatus of plural charged-particle beams Weiming Ren, Xuerang Hu, Zhongwei Chen 2023-02-21
11569060 Methods and apparatuses for adjusting beam condition of charged particles 2023-01-31
11541867 Method and device for controlling motion of vehicle, and vehicle Shengbo Li, Bo Cheng, Keqiang LI, Hongbo Gao, Qingfeng Lin +5 more 2023-01-03
11538655 Multi-beam inspection apparatus Xuerang Hu, Zhong-Wei Chen, Weiming Ren 2022-12-27
11513087 Systems and methods for voltage contrast defect detection Weiming Ren, Zhong-Wei Chen, Xiaoyu JI, Xiaoxue CHEN, Weimin Zhou +1 more 2022-11-29
11469076 System and method for scanning a sample using multi-beam inspection apparatus Martinus Gerardus Maria Johannes Massen, Joost Jeroen Ottens, Long Ma, Youfei Jiang, Weihua Yin +1 more 2022-10-11
11469074 Multiple charged-particle beam apparatus with low crosstalk Weiming Ren, Xuerang Hu, Qingpo Xi 2022-10-11
11430631 Methods of inspecting samples with multiple beams of charged particles Kuo-Shih Liu, Wei Fang, Jack Jau 2022-08-30
11398368 Apparatus of plural charged-particle beams Weiming Ren, Xuerang Hu, Zhongwei Chen 2022-07-26
11328894 Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus Weiming Ren, Xuerang Hu, Xinan Luo, Zhongwei Chen 2022-05-10
11302514 Apparatus for multiple charged-particle beams Weiming Ren, Xuerang Hu, Zong-wei Chen 2022-04-12
11289304 Apparatus using multiple beams of charged particles Xuerang Hu, Weiming Ren, Zhong-Wei Chen 2022-03-29
11282675 Multi-beam inspection apparatus with improved detection performance of signal electrons Weiming Ren, Xuerang Hu, Zhong-Wei Chen 2022-03-22
11232928 Multi-beam inspection apparatus Weiming Ren, Qian Zhang, Xuerang Hu 2022-01-25
11217423 Apparatus of plural charged-particle beams Weiming Ren, Shuai Li, Zhongwei Chen, Jack Jau 2022-01-04
11107657 Apparatus of plural charged-particle beams Weiming Ren, Shuai Li, Zhongwei Chen 2021-08-31
11062874 Apparatus using multiple charged particle beams Weiming Ren, Xuerang Hu, Zhong-Wei Chen 2021-07-13
11062877 Apparatus of plural charged-particle beams Shuai Li, Weiming Ren, Juying Dou, Xuerang Hu, Zhongwei Chen 2021-07-13
11043354 Apparatus of plural charged-particle beams Weiming Ren, Shuai Li, Zhongwei Chen 2021-06-22