Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11469076 | System and method for scanning a sample using multi-beam inspection apparatus | Joost Jeroen Ottens, Long Ma, Youfei Jiang, Weihua Yin, Wei Li +1 more | 2022-10-11 |