Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12374524 | In-lens wafer PE-charging and inspection with multiple beams | Youfei Jiang | 2025-07-29 |
| 12165837 | System and method for scanning a sample using multi-beam inspection apparatus | Martinus Gerardus Johannes Maria MAASSEN, Joost Jeroen Ottens, Long Ma, Youfei Jiang, Wei Li +1 more | 2024-12-10 |
| 11469076 | System and method for scanning a sample using multi-beam inspection apparatus | Martinus Gerardus Maria Johannes Massen, Joost Jeroen Ottens, Long Ma, Youfei Jiang, Wei Li +1 more | 2022-10-11 |
| 11152191 | In-lens wafer pre-charging and inspection with multiple beams | Youfei Jiang | 2021-10-19 |
| 8725115 | Method and system for processing message | Qingquan Liu, Lixin Hu, Yang Wang, Ning Chen | 2014-05-13 |